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Yulin Jiao's Research Group Discovers a New Gene for Wheat Yield Increase

For major crops, the number of grains per spike is one of the three key factors determining yield. Wheat spikes consists of spikelets through branching, with florets forming on these spikelets that subsequently developing into grains. Increasing the number of smaller spikelets is an important route to enhancing yield. On July 18, 2022, Yulin Jiao's research group from the Peking University Institute of Advanced Agricultural Sciences / School of Life Sciences at Peking University, published a research paper in Nature Plants entitled "Improving bread wheat yield through modulating an unselected AP2/ERF gene", reporting on a novel gene, DUO-B1, that increases the number of spikelets. This gene, contributing to yield enhancement by raising the number of spikelets, holds significant meaning for deeply analyzing the mechanism of wheat yield trait formation. Simultaneously, it provides an important gene resource for high-yield wheat breeding. Nature Plants simultaneously published a research brief "Gain in grain yield in wheat with extra spikelets", introducing this research.